In-growth test for monolithic 3D integrated SRAM.

Pu Pang Yixun Zhang Tianjian Li Sung Kyu Lim Quan Chen Xiaoyao Liang Li Jiang

Published in: DATE (2018)

Keyphrases

test cases
power consumption
data transmission
information retrieval
genetic algorithm
low cost
test data
database
data sets
learning algorithm
bayesian networks
evolutionary algorithm