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A Current Injection Built-In Test Technique for RF Low-Noise Amplifiers.
Xiaohua Fan
Marvin Onabajo
Félix O. Fernandez-Rodriguez
José Silva-Martínez
Edgar Sánchez-Sinencio
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2008)
Keyphrases
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low signal to noise ratio
random noise
test cases
missing data
noisy data
high noise
multiresolution
frequency domain
signal to noise ratio
high levels
neural network
information systems
image compression
noise level
radio frequency