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Cu-Cu Bonding Challenges with 'i-ACF' for Advanced 3D Integration.

Shunji KurookaYoshinori HottaAi NakamuraMitsumasa KoyanagiTakafumi Fukushima
Published in: 3DIC (2019)
Keyphrases
  • electron microscopy
  • mechanical properties
  • key issues
  • computer vision
  • real world
  • lessons learned
  • knowledge base
  • data analysis
  • evolutionary algorithm
  • experimental data
  • technical challenges
  • technical solutions