Binary and Multi-label Defect Classification of Printed Circuit Board based on Transfer Learning.
George O. de A. AzevedoLeandro H. de S. SilvaAgostinho A. F. JúniorBruno J. T. FernandesSergio C. OliveiraPublished in: ESANN (2020)
Keyphrases
- transfer learning
- multi label
- printed circuit boards
- text categorization
- defect classification
- text classification
- learning tasks
- multi label classification
- image annotation
- labeled data
- semi supervised learning
- image classification
- cross domain
- graph cuts
- feature selection
- visual inspection
- class labels
- reinforcement learning
- binary classification
- multi task
- active learning
- integrated circuit
- machine learning
- multi task learning
- machine learning algorithms
- k nearest neighbor
- text mining
- collaborative filtering
- decision trees
- naive bayes
- unsupervised learning
- binary classifiers
- knn
- manufacturing process
- artificial intelligence
- unlabeled data
- target domain
- learning problems
- supervised learning
- semi supervised
- domain knowledge
- pairwise
- learning algorithm