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Evaluation of Physical Unclonable Functions for 28-nm Process Field-Programmable Gate Arrays.

Yohei HoriHyunho KangToshihiro KatashitaAkashi SatohShin-ichi KawamuraKazukuni Kobara
Published in: J. Inf. Process. (2014)
Keyphrases
  • embedded systems
  • neural network
  • general purpose
  • development process
  • hardware implementation
  • parallel architectures
  • programmable logic