Diagnosing Silicon Failures Based on Functional Test Patterns.

Chia-Chih Yen Ten Lin Hermes Lin Kai Yang Ta-Yung Liu Yu-Chin Hsu

Published in: MTV (2006)

Keyphrases

high speed
pattern mining
high density
knowledge base
database systems
low cost
data mining techniques
test data
sequential patterns
pattern discovery
temporal patterns
dynamic range
root cause