Bipartite Full Scan Design: A DFT Method for Asynchronous Circuits.
Hiroshi IwataSatoshi OhtakeMichiko InoueHideo FujiwaraPublished in: Asian Test Symposium (2010)
Keyphrases
- high precision
- preprocessing
- computationally efficient
- prior knowledge
- clustering method
- dynamic programming
- knowledge based systems
- asynchronous circuits
- detection method
- optimization algorithm
- support vector machine svm
- high accuracy
- experimental evaluation
- feature selection
- computational cost
- segmentation algorithm
- significant improvement
- case study
- synthetic data
- learning algorithm