Accumulator based Test-per-Scan BIST.

P. Karpodinis Dimitri Kagaris Dimitris Nikolos

Published in: IOLTS (2004)

Keyphrases

built in self test
test cases
hough transform
statistical significance
neural network
artificial intelligence
case study
high level
training data
multiscale
objective function
information technology
pairwise
color images
software testing