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In-situ characterization and extraction of SRAM variability.

Srivatsan ChellappaJia NiXiaoyin YaoNathan D. HindmanJyothi VelamalaMin ChenYu CaoLawrence T. Clark
Published in: DAC (2010)
Keyphrases
  • power consumption
  • low power
  • image processing
  • multiscale
  • data transmission
  • database
  • case study
  • knowledge extraction
  • automatic extraction
  • random access memory