Dynamic effects in the detection of bridging faults in CMOS ICs.

Michele Favalli Piero Olivo Bruno Riccò

Published in: J. Electron. Test. (1992)

Keyphrases

low cost
detection algorithm
automatic detection
expert systems
detection accuracy
fault detection and isolation
object detection
high speed
dynamic environments
false alarms
detection method
abnormal events
model based diagnosis
event detection
false positives
information systems
image sequences