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Study of forward AC stress degradation of GaN-on-Si Schottky diodes.

Thomas LorinWilliam VandendaeleRomain GwozieckiCharlotte GillotJérome BiscarratGérard GhibaudoFred Gaillard
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • multiscale
  • database
  • computer vision
  • database systems
  • similarity measure
  • video sequences
  • empirical studies
  • design methodology