Intraclass Image Augmentation for Defect Detection Using Generative Adversarial Neural Networks.
Vignesh SampathIñaki MaurtuaJuan José Aguilar MartínAnder IriondoIker LluviaGotzone AizpuruaPublished in: Sensors (2023)
Keyphrases
- defect detection
- intra class
- image features
- image data
- input image
- image content
- image classification
- multiscale
- image retrieval
- image segmentation
- high resolution
- spatial information
- feature points
- image regions
- viewpoint
- keypoints
- image representation
- generative model
- test images
- object classes
- similarity measure
- feature extraction