Towards a Uniform Notation for Memory Tests.

Ad J. van de Goor Aad Offerman Ivo Schanstra

Published in: ED&TC (1996)

Keyphrases

memory space
memory requirements
neural network
low memory
test cases
linear array
memory usage
expert systems
information retrieval
information processing
database
multiscale
computing power
random access
artificial intelligence
memory size
real time