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Modeling of Tunneling Current in Nanostructures Taking into Account the Effect of Electron-electron Interaction.

Igor BoykoYuriy StoianovHalyna TsuprykOksana PryvedaIaroslav Kinakh
Published in: CSIT (1) (2020)
Keyphrases
  • electron microscope
  • electron beam
  • electron microscopy
  • electric field
  • data sets
  • website
  • image sequences
  • human computer interaction
  • human interaction
  • multi touch
  • metal oxide
  • van der waals