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A Ka-band Switched-Capacitor RFDAC Using Edge-Combining in 22nm FD-SOI.

Hieu Minh NguyenJeffrey S. WallingAnding ZhuRobert Bogdan Staszewski
Published in: VLSI Circuits (2021)
Keyphrases
  • silicon on insulator
  • metal oxide
  • edge information
  • data sets
  • multiple scales
  • multiscale
  • edge detection
  • frequency band