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Partial-scan delay fault testing of asynchronous circuits.

Michael KishinevskyAlex KondratyevLuciano LavagnoAlexander SaldanhaAlexander Taubin
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1998)
Keyphrases
  • asynchronous circuits
  • delay insensitive
  • process algebra
  • fault model
  • fault detection
  • model checking
  • fault injection
  • fault diagnosis
  • data sets
  • real time embedded systems
  • database
  • distributed systems