On the adoption of MC/DC and control-flow adequacy for a tight integration of program testing and statistical fault localization.
Bo JiangKe ZhaiW. K. ChanT. H. TseZhenyu ZhangPublished in: Inf. Softw. Technol. (2013)
Keyphrases
- software testing
- fault localization
- control flow
- tight integration
- test cases
- program understanding
- software development
- program slicing
- software systems
- test suite
- software engineering
- e government
- development process
- databases
- expert systems
- information systems
- data flow
- test set
- distributed systems
- fuzzy logic
- high level
- case study
- artificial intelligence
- neural network