Characterization of the thermal conductivity of insulating thin films by scanning thermal microscopy.
Séverine GomèsPascal NewbyBruno CanutKonstantinos TermentzidisOlivier MartyLuc FrechettePatrice ChantrenneVincent AimezJean-Marie BluetVladimir LysenkoPublished in: Microelectron. J. (2013)