Teager-Kaiser Energy and Higher-Order Operators in White-Light Interference Microscopy for Surface Shape Measurement.
Fabien SalzensteinPaul C. MontgomeryDenis MontanerAbdel-Ouahab BoudraaPublished in: EURASIP J. Adv. Signal Process. (2005)
Keyphrases
- surface shape
- higher order
- white light
- specular reflection
- image formation
- surface normals
- planar surfaces
- image analysis
- surface orientation
- light source
- pairwise
- natural images
- photometric stereo
- lighting conditions
- curved surfaces
- image processing
- image segmentation
- image pairs
- shape from shading
- active contours
- perspective projection
- markov random field
- motion estimation
- d objects
- high resolution
- viewpoint