Built-in Loopback Test for IC RF Transceivers.

Jerzy J. Dabrowski Rashad Ramzan

Published in: IEEE Trans. Very Large Scale Integr. Syst. (2010)

Keyphrases

computer vision
radio frequency
artificial neural networks
test data
neural network
decision making
multimedia
three dimensional
database systems
feature extraction
bayesian networks
preprocessing
test cases
wireless networks