Electromigration Reliability of VLSI Interconnect.
J. Joseph ClementEugenia M. AtakovJames R. LloydPublished in: Digit. Tech. J. (1992)
Keyphrases
- high speed
- power dissipation
- signal processing
- reliability assessment
- vlsi design
- search algorithm
- power consumption
- feature selection
- reliability analysis
- artificial intelligence
- multi agent
- evolutionary algorithm
- three dimensional
- decision trees
- input output
- low power
- software reliability
- vlsi circuits
- information retrieval