J. Joseph Clement

Publication Activity (10 Years)

Years Active: 1992-2002
Publications (10 Years): 0

Publications

J. Joseph Clement
Electromigration Reliability Issues in High-Performance Circuit Design (Tutorial Abstract). ISQED (2002)
J. Joseph Clement, Stefan P. Riege, Radenko Cvijetic, Carl V. Thompson
Methodology for electromigration critical threshold design rule evaluation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18 (5) (1999)
J. Joseph Clement, Eugenia M. Atakov, James R. Lloyd
Electromigration Reliability of VLSI Interconnect. Digit. Tech. J. 4 (2) (1992)