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Generating test patterns for sequential circuits using random patterns by PLI functions.

Mohammad Hashem HaghbayanAlireza YazdanpanahSara KaramatiRamyar SaeediZainalabedin Navabi
Published in: EWDTS (2010)
Keyphrases
  • test cases
  • data mining techniques
  • pattern discovery
  • similar patterns
  • databases
  • neural network
  • evolutionary algorithm
  • high speed
  • basis functions
  • pattern mining