Automatic Error Detection in Integrated Circuits Image Segmentation: A Data-driven Approach.
Zhikang ZhangBruno Machado TrindadeMichael GreenZifan YuChristopher PawlowiczFengbo RenPublished in: CoRR (2022)
Keyphrases
- integrated circuit
- error detection
- image segmentation
- error correction
- data driven
- error recovery
- data cleansing
- error correcting
- fault tolerance
- multiscale
- features extraction
- error resilient
- electron beam
- image processing
- artificial intelligence
- fault isolation
- computer vision
- deformable models
- active contours
- graph cuts
- region growing
- markov random field