Ensuring accuracy in optical and electrical measurement of ultra-bright LEDs during reliability test.
Sihan Joseph ChenCher Ming TanBoon Khai Eric ChenZhi Yong Shaun ChuaPublished in: Microelectron. Reliab. (2012)
Keyphrases
- fold cross validation
- high accuracy
- prediction accuracy
- high speed
- computational efficiency
- computational cost
- neural network
- high precision
- test cases
- error rate
- classification accuracy
- computational complexity
- data sets
- test data
- case study
- feature selection
- highly accurate
- statistical significance
- measurement error
- fiber optic