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Concurrent Error Detectable Carry Select Adder with Easy Testability.

Nobutaka KitoNaofumi Takagi
Published in: IEEE Trans. Computers (2019)
Keyphrases
  • error rate
  • data flow
  • generalization error
  • mutual exclusion
  • real time
  • data sets
  • machine learning
  • estimation error
  • error detection
  • error free
  • test data generation
  • concurrent programs