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Oscillation-test strategy for analog and mixed-signal integrated circuits.

Karim ArabiBozena Kaminska
Published in: VTS (1996)
Keyphrases
  • integrated circuit
  • mixed signal
  • low power
  • multi channel
  • vlsi circuits
  • digital circuits
  • low cost
  • built in self test
  • high speed
  • real time
  • power consumption
  • electron beam
  • low voltage
  • cmos technology