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Circuit Testing Using the Principles of Self-Nonself Discrimination.
Cleonilson Protásio de Souza
Francisco Marcos de Assis
Raimundo Carlos Silvério Freire
Published in:
IEEE Trans. Instrum. Meas. (2008)
Keyphrases
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circuit design
electronic circuits
feature selection
test set
theoretical framework
databases
neural network
data mining
information systems
high speed
test cases
parallel processing
digital circuits
delay insensitive
duty cycle