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Testing and improvement of micro-optical-switch dynamics.

Christian RembeHarald AschemannStefan aus der WiescheEberhard P. HoferHélène DebédaJürgen MohrUlrike Wallrabe
Published in: Microelectron. Reliab. (2001)
Keyphrases
  • high speed
  • neural network
  • test cases
  • dynamical systems
  • dynamic model
  • hidden markov models
  • packet switching
  • test set
  • initial conditions
  • temporal evolution
  • test generation