DC-bias-voltage dependence of degradation of aluminum electrolytic capacitors.

Kazunori Hasegawa K. Tsuzaki Shinichi Nishizawa

Published in: Microelectron. Reliab. (2018)

Keyphrases

short circuit
thin film
metal oxide
active power filter
high voltage
pwm rectifier
x ray
power system
bayesian networks
power consumption
output voltage
multi layer
integrated circuit
electric field
dependence structure
duty cycle