Toward Gated-Diode-BIMOS for thin silicon ESD protection in advanced FD-SOI CMOS technologies.
Louise De ContiThomas BedecarratsMaud VinetSorin CristoloveanuPhilippe GalyPublished in: ICICDT (2017)
Keyphrases
- silicon on insulator
- high speed
- low cost
- web intelligence
- cmos technology
- computer simulation
- information security
- data mining
- metal oxide semiconductor
- gate dielectrics
- power consumption
- low power
- emerging technologies
- ibm power processor
- high density
- delay insensitive
- data protection
- signal analysis
- circuit design
- signal processing
- multiresolution