Login / Signup

Improving the Proportion of At-Speed Tests in Scan BIST.

Yu HuangIrith PomeranzSudhakar M. ReddyJanusz Rajski
Published in: ICCAD (2000)
Keyphrases
  • high speed
  • real time
  • expert systems
  • processing speed
  • database
  • data mining
  • information systems
  • high level
  • database systems
  • cooperative