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New Topology Approach for Future Process, Voltage and Temperature Aware SRAM Using Independently Controlled Double-Gate FinFET.
Nandakishor Yadav
Manisha Pattanaik
G. K. Sharma
Published in:
J. Low Power Electron. (2015)
Keyphrases
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power consumption
power system
success or failure
database
neural network
computational intelligence
room temperature