ECC-Based Bit-Write Reduction Code Generation for Non-Volatile Memory.
Masashi TawadaShinji KimuraMasao YanagisawaNozomu TogawaPublished in: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2015)
Keyphrases
- code generation
- main memory
- application development
- software development
- code generator
- random access memory
- formal specification
- flash memory
- model driven
- modeling language
- error correction
- rapid prototyping
- data storage
- design patterns
- software reuse
- file system
- elliptic curve
- development process
- metamodel
- service oriented
- index structure