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Enabling Remote Testing: Embedded Test Controller and Mixed-signal Test Architecture.

Jari HannuTeuvo SaikkonenJuha HäkkinenJuha KarttunenMarkku Moilanen
Published in: J. Electron. Test. (2010)
Keyphrases
  • real time
  • test cases
  • statistical tests
  • low cost
  • control strategy
  • design considerations
  • test generation
  • vlsi circuits