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Generating Test Patterns for Chiplet Interconnects: Achieving Optimal Effectiveness and Efficiency.
Po-Yao Chuang
Francesco Lorenzelli
Erik Jan Marinissen
Published in:
ITC-Asia (2023)
Keyphrases
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input output
databases
optimal solution
computational complexity
data analysis
computational efficiency
machine learning
genetic algorithm
feature selection
dynamic programming
test data
sequential patterns
pattern mining
pattern analysis