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Attractive electron-electron interactions within robust local fitting approximations.
Patrick Merlot
Thomas Kjærgaard
Trygve Helgaker
Roland Lindh
Francesco Aquilante
Simen Reine
Thomas Bondo Pedersen
Published in:
J. Comput. Chem. (2013)
Keyphrases
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van der waals
electron beam
electric field
electron microscopy
electron microscope
electrical properties
high energy
closed form
parameter tuning
computationally efficient
database
parameter estimation
least squares
face recognition
search engine
data mining
databases
data sets