Detecting memory faults in the presence of bit line coupling in SRAM devices.

Sandra Irobi Zaid Al-Ars Said Hamdioui

Published in: ITC (2010)

Keyphrases

random access memory
design considerations
low voltage
fault diagnosis
embedded dram
fault detection
memory access
line segments
main memory
mobile devices
memory requirements
line drawings
data transmission
smart phones
fault model
fuzzy logic
control system