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Black Box Polynomial Identity Testing of Depth-3 Arithmetic Circuits with Bounded Top Fan-in.
Zohar Shay Karnin
Amir Shpilka
Published in:
Electron. Colloquium Comput. Complex. (2007)
Keyphrases
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black box
test cases
white box
integration testing
white box testing
black boxes
software testing
depth map
test suite
rule extraction
truth table
depth information
feature space
test data
hybrid systems
delay insensitive
software development
open source