A Unified Physics-Based Stochastic Model for EM-Induced Resistance Degradation in BEoL Interconnect Segments.
Valeriy SukharevJun-Ho ChoyArmen KteyanJ. Shuster-PassageSeungman ChoiM. GallPublished in: IRPS (2024)
Keyphrases
- stochastic model
- stochastic process
- stochastic models
- expectation maximization
- high speed
- market demand
- maximum likelihood
- deformable models
- fluid model
- em algorithm
- image formation
- unsupervised learning
- unified model
- generative model
- equal length
- expectation maximisation
- image segmentation
- constrained optimization
- parameter estimation