A logic built-in self-test architecture that reuses manufacturing compressed scan test patterns.

Diogo José Costa Alves Edna Barros

Published in: SBCCI (2009)

Keyphrases

built in self test
integrated circuit
pattern discovery
quality control
pattern mining
management system
design patterns
real time
software architecture
pattern matching
data mining techniques
network architecture
object oriented
compressed domain
manufacturing industry
scan data
decision making