A Built-In Self-Testing Approach for Minimizing Hardware Overhead.
Scott ChiuChristos A. PapachristouPublished in: ICCD (1991)
Keyphrases
- low cost
- real time
- hardware and software
- vlsi implementation
- massively parallel
- embedded systems
- test cases
- hardware implementation
- computer systems
- image processing
- test set
- personal computer
- digital circuits
- data processing
- control system
- database systems
- case study
- computational power
- learning algorithm
- test suite
- software testing
- high end
- databases