Feature extraction using sequential cumulative bin and overlap mean intensity for iris classification.
Ahmad Nazri AliShahrel Azmin SuandiMohd Zaid AbdullahPublished in: Turkish J. Electr. Eng. Comput. Sci. (2018)
Keyphrases
- feature extraction
- image classification
- feature vectors
- pattern recognition
- pattern classification
- support vector machine svm
- iris recognition
- feature selection
- dimension reduction
- preprocessing
- image feature extraction
- feature space
- classification accuracy
- feature extraction and classification
- classification scheme
- class labels
- automatic classification
- extracted features
- feature set
- text classification
- image features
- face recognition
- decision trees
- feature representation
- iris images
- gabor wavelets
- training samples
- principle component analysis
- texture feature extraction
- classification method
- classification algorithm
- frequency domain
- model selection
- dimensionality reduction
- face images
- wavelet transform
- support vector machine
- image processing