IRIS RECOGNITION
Experts
- Christoph Busch
- Andreas Uhl
- Kevin W. Bowyer
- Zhenan Sun
- Arun Ross
- Tieniu Tan
- Adam Czajka
- Christian Rathgeb
- Fernando Alonso-Fernandez
- Patrick J. Flynn
- Julian Fiérrez
- Josef Bigün
- Mateusz Trokielewicz
- David Zhang
- Kiran B. Raja
- Hugo Proença
- Anil K. Jain
- Ramachandra Raghavendra
- Richa Singh
- Kang Ryoung Park
- Ajay Kumar
- Mayank Vatsa
- Phalguni Gupta
- Rubén Vera-Rodríguez
- Naser Damer
- Piotr Maciejewicz
- Marios Savvides
- Gian Luca Marcialis
- Raul Sánchez-Reillo
- Aythami Morales
- Prabir Bhattacharya
- Javier Ortega-Garcia
- Juan E. Tapia
- Nalini K. Ratha
- Michele Nappi
- Bernadette Dorizzi
- Farzin Deravi
- Rubén Tolosana
- Kaushik Roy
Venues
- CoRR
- IEEE Access
- Sensors
- ICB
- IEEE Trans. Inf. Forensics Secur.
- Pattern Recognit. Lett.
- Multim. Tools Appl.
- ICPR
- BTAS
- IJCB
- ICIP
- CCBR
- IET Biom.
- Pattern Recognit.
- BIOSIG
- CVPR Workshops
- Int. J. Biom.
- Image Vis. Comput.
- ICASSP
- IWBF
- EUSIPCO
- Neurocomputing
- Wirel. Pers. Commun.
- Int. J. Distributed Sens. Networks
- Expert Syst. Appl.
- J. Electronic Imaging
- Signal Image Video Process.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Int. J. Pattern Recognit. Artif. Intell.
- AVBPA
- SMC
- 计算机科学
- IEEE Trans. Instrum. Meas.
- EMBC
- SIU
- IEEE Trans. Image Process.
- WACV
- IIH-MSP
- IJCNN
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