Pipelined Diagnosis of Wafer-Scale Linear Arrays.

Sampath Rangarajan Donald S. Fussell Miroslaw Malek

Published in: J. Parallel Distributed Comput. (1994)

Keyphrases

linear array
morphological scale space
integrated circuit
high speed
linear systems
closed form
multiple faults
semiconductor manufacturing
model based reasoning
fault detection
data sets
fault diagnosis
scale space
multiscale
image segmentation
website
information systems
genetic algorithm