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Efficient BIST TPG design and test set compaction for delay testing via input reduction.

C.-A. ChenS. K. Gupta
Published in: ICCD (1998)
Keyphrases
  • test set
  • error rate
  • training set
  • test data
  • test cases
  • training data
  • design process
  • evaluation methodology
  • database
  • neural network
  • user interface