Pass Transistor XOR Gate Based Radiation Hardened RO-PUF.

Syed Farah Naz Sajid Khan Ambika Prasad Shah

Published in: VDAT (2022)

Keyphrases

silicon dioxide
leakage current
field effect transistors
electronic devices
high speed
x ray
infrared
integrated circuit
metal oxide semiconductor
low power
steady state
nano scale
data sets
low voltage
multiple input
mathematical analysis
power line
high density
smart phones
database systems
real time