Deep Learning Algorithms for the Work Function Fluctuation of Random Nanosized Metal Grains on Gate-All-Around Silicon Nanowire MOSFETs.
Chandni AkbarYiming LiWen-Li SungPublished in: IEEE Access (2021)
Keyphrases
- field effect transistors
- learning algorithm
- grain size
- machine learning
- deep architectures
- high speed
- machine learning algorithms
- training data
- learning process
- high density
- low cost
- steady state
- silicon dioxide
- supervised learning
- active learning
- uniform distribution
- learning scheme
- boolean functions
- back propagation
- data sets