Managing test coverage uncertainty due to thermal noise in nano-CMOS: A case-study on an SRAM array.
Vikram B. SureshSandip KunduPublished in: ICCD (2013)
Keyphrases
- random access memory
- power consumption
- sensor noise
- low power
- test suite
- low cost
- measurement errors
- image sensor
- measurement noise
- thermal images
- measurement error
- random noise
- test bed
- missing data
- software testing
- design considerations
- noisy data
- infrared
- focal plane
- high speed
- low voltage
- neural network
- code coverage
- noise level
- noise reduction
- signal to noise ratio
- case study