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On Thermal Effects in Deep Sub-Micron VLSI Interconnects.

Kaustav BanerjeeAmit MehrotraAlberto L. Sangiovanni-VincentelliChenming Hu
Published in: DAC (1999)
Keyphrases
  • infrared
  • power dissipation
  • high speed
  • input output
  • vlsi circuits
  • signal processing
  • electron beam
  • low power
  • vlsi design
  • information systems
  • power consumption
  • single chip
  • cmos technology