• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

On Thermal Effects in Deep Sub-Micron VLSI Interconnects.

Kaustav BanerjeeAmit MehrotraAlberto L. Sangiovanni-VincentelliChenming Hu
Published in: DAC (1999)
Keyphrases
  • infrared
  • power dissipation
  • high speed
  • input output
  • vlsi circuits
  • signal processing
  • electron beam
  • low power
  • vlsi design
  • information systems
  • power consumption
  • single chip
  • cmos technology